Keysight Engineering Education for Data Center Infrastructure

Created January 22, 2020
Product Focus

Data center infrastructure constantly evolves. Emerging technologies such as 5G, AI, virtual reality (VR), IoT, and autonomous vehicles generate explosive amounts of data in the network and create new computing and performance demands in the data center.

We offer the widest array of data center test solutions across all network layers, from physical Layer 1 test to full network test of Layers 2–7 including software-defined networking (SDN)/network functions virtualization (NFV) validation, and traffic loading. We accelerate data center infrastructure innovations so that you can focus on the fast deployment of new services.

To aid you, the engineers designing, testing and making the future of these technologies a reality, Keysight Technologies has compiled a program of free of charge webinars. Available both live and on-demand, these presentations help you remain at the forefront of these everchanging environments. Each of the Webinars have a wide array of downloadable resources and is available on-demand after the live broadcast dates.

Upcoming webinars include:

Eliminate FEC Frame Loss in 400G Optical Links and Components 23/01/2020

In this webinar you will learn how to design and validate FEC-aware 400G systems and components, optical transceivers, and copper cables. We will discuss how to measure and debug FEC errors and unacceptable BER and FLR limits.

 

Addressing Interoperable Coherent Transceiver Test Challenges 5/02/2020

Discover how standard bodies tackle challenges by extending existing standards, such as ITU’s G698.2, and crafting new implementation agreements, such as OIF’s 400ZR

Learn specifications and test methods required to achieve interoperable coherent optical transceivers,  component-level specifications and corresponding test solutions

 

Wafer-Level Opto-Electrical Measurements for Integrated & Silicon Photonics 4/03/2020

This webinar explains the setup and measurement methods for on-wafer parametric optical and high-frequency characterization of integrated photonics devices.

Learn more and register >> 

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This article was written
by Optical Connections News Team