Keysight Technologies, has launched the NX5402A Silicon Photonics Test System integrated with Keysight PathWave Semiconductor Test software technology (part of Keysight PathWave Test software), which enables semiconductor manufacturers to speed delivery of silicon photonics wafer production with stable and repeatable test capabilities.
Keysight says the NX5402A Silicon Photonics test system delivers proven measurement technologies and direct support capabilities including integrated optical and electrical test capabilities and Keysight-developed fibre alignment and positioning system based on Keysight’s measurement science; elimination of manual operations with PathWave Semiconductor Test software which is compatible with Keysight’s SPECS software, enabling one-pass silicon photonics testing; factory automation software, safety interlock and clean room ready features support manufacturing use, providing high throughput testing based on multi-channel optical and electrical test architecture, as well as optimized fiber alignment and high accuracy, repeatability and reproducibility from laboratory to fabrication, delivering advanced wafer-level photonic calibration, as well as reliable performance monitoring with built-in automatic system diagnostics.
“Ahead of the growing market demand for silicon photonics, Keysight is excited to announce the first test solution for silicon photonics volume production market,” said Shinji Terasawa, vice president and general manager of Keysight’s Wafer Test Solutions group. “Our NX5402A test system is the first solution that combines Keysight’s expertise in electrical and optical measurement with Keysight’s fibre alignment and positioning system integrated by PathWave Semiconductor Test software.”
For more information, visit www.keysight.com