New Silicon Photonics T&M Collaboration
Semiconductor industry electrical test and measurement supplier FormFactor has deployed an integrated CM300xi probing solution for wafer-level testing of silicon photonics (SiPh) devices. The T&M specialist says it worked with teams from semiconductor house GLOBALFOUNDRIES (GF) and photonics test and measurement company Keysight Technologies to make the system flexible to accommodate various engineering needs and […]