Tektronix announce New Advances in Optical Measurements for 100G, 400G Standards

Created May 5, 2017
Technologies and Products

With 100G moving into production and 400G design efforts in full swing, the test challenges around characterization, verification and debug of both silicon and system designs have never been greater.
Tektronix will be demonstrating a number of new innovative solutions supporting latest 100G/400G standards , including these advances: high-sensitivity single-mode/multi-mode optical module for NRZ and PAM4 up to 32GBd, real-time oscilloscope PAM4 analysis with live triggering and error detection for 400G standards, industry’s only multi-OMA system for applications such as Spatial Division Multiplexing and technology advances in both real-time and sampling O-E technologies.

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This article was written
by Optical Connections News Team